If you are looking to receive a personalized quote for the MD2764 25 B, Fastener Orbit is your sourcing solution. MD2764 25 B manufactured by Intel Corp Sales Office and is described as a Microcircuit Memory, listed alongside the part number MD2764 25 B. This item, alongside the many other NSN parts listed on our website, is readily available for purchase at any time. When you complete the RFQ form below, we ask that you provide us all required information so that we may best create a solution that fits your particular needs and requirements.
As a leading distributor of NSN parts and components, we invite you to peruse our inventory to find all the CAGE Code 34649 parts and other Intel Corp Sales Office products that you require such as NSN 5962-01-176-3078. Adhering to strict quality control regulations and requirements, we proudly operate with AS9120B, ISO 9001:2015, and FAA AC 00-56B certification and accreditation. Furthermore, our items are all sourced from leading global manufacturers and an approved vendor list (AVL) as a part of our NO CHINA SOURCING pledge. If you have any questions regarding our offered services or would like to see how we can meet your specific needs, give our team members a call or email at your earliest convenience and they would be more than happy to assist you.
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 1.460 INCHES NOMINAL |
ADAT | BODY WIDTH | 0.610 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.140 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
AGAV | END ITEM IDENTIFICATION | LANDING CRAFT AIR CUSHION (LCAC), TARAWA CLASS LHA, NIMITZ CLASS CVN, FORRESTAL CLASS CV, EMORY S. LAND, WASP CLASS LHD. B-1B AIRCRAFT. 2M/ATE MICROMINIAUTURE AUTOMATIC TEST EQUIPMENT. |
CBBL | FEATURES PROVIDED | PROGRAMMABLE AND HERMETICALLY SEALED AND 3-STATE OUTPUT AND ULTRAVIOLET ERASABLE |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 16 INPUT |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.6 VOLTS MINIMUM POWER SOURCE AND 22.0 VOLTS MAXIMUM POWER SOURCE |
CZEQ | TIME RATING PER CHACTERISTIC | 300.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 300.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
CZER | MEMORY DEVICE TYPE | ROM |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
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